SAN FRANCISCO—Amit Khanna, PE, LEED AP, has joined HOK’s San Francisco office as vice president and regional director of the firm’s mechanical, electrical and plumbing (MEP) engineering practice.
Khanna specializes in high-performance building design for high-tech and commercial facilities. Over the past decade, he has developed a global perspective on sustainable design and facility operations while leading projects across the Americas and Asia. He believes that simple engineering solutions using timeless, climate-responsive and progressive technologies create the highest-performing buildings.
“Amit comes to us with a diverse background spanning engineering, architecture and sustainability,” said Anton Foss, AIA, HOK’s managing principal in San Francisco. “He will be a key part of the highly integrated design process that is at the core of our approach.”
Khanna will oversee the practice’s portfolio of current engineering projects including the Salt Lake City International Airport Passenger Terminal and the San Francisco Forensics Lab. He will also focus on collaborating with regional HOK offices to continue expanding the integrated practice.
Prior to joining HOK, Khanna was an associate at Arup, leading teams on projects ranging from large-scale campuses to data centers and laboratories. In 2013, he was honored with Consulting-Specifying Engineer’s 40 Under 40 award, recognizing him as one of the top young leaders in the building industry. Khanna has a Master of Science in Architecture with concentrations in Building Sciences and Building Physics from Virginia Polytechnic Institute and State University, and a Bachelor of Architecture from the Indian Institute of Technology.
HOK is a global design, architecture, engineering and planning firm. Through a network of 24 offices worldwide, HOK provides design excellence and innovation to create places that enrich people’s lives and help clients succeed. DesignIntelligence consistently ranks HOK as a leader in sustainable, high-performance design and technology innovation.